The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 06, 1990

Filed:

Oct. 26, 1988
Applicant:
Inventors:

Masayuki Hideshima, Tokyo, JP;

Shinji Wada, Tokyo, JP;

Akihiko Sekine, Tokyo, JP;

Takashi Yokokura, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ; A61B / ;
U.S. Cl.
CPC ...
351221 ; 351206 ;
Abstract

A laser beam scanning type ophthalmological instrument has a first laser beam light source for emitting a first laser beam; a second laser beam light source for emitting a second laser beam of a different wavelength from that of the first laser beam; and a light receiving element for receiving a laser beam reflected by an eye fundus, and in which the eye fundus is scanned by the first and second laser beams in order to observe the eye fundus or in order that a view field, etc. can be inspected. The laser beam scanning type ophthalmological instrument is characterized in that the first and second laser beams emitted by the first and second laser beam light sources can independently be adjusted in light quantity.


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