The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 1990
Filed:
Aug. 01, 1989
Russell A Budd, Longmont, CO (US);
Bruce D Gibson, Louisville, CO (US);
Sherwood Kantor, Boulder, CO (US);
Wayne A Overby, Longmont, CO (US);
Mikel J Stanich, Longmont, CO (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
This is an electronic scheme for correcting for mechanical misalignment and chromatic aberrations from laser beam to laser beam in the scan direction of a multiple beam laser scanning system for use in an electrophotographic machine. Each beam is first corrected for mechanical misalignment and thereafter for chromatic aberrations. A reference laser beam produces two pulses near the start of scan (SOS) and two pulses near the end of scan (EOS). A non-reference laser beam then produces SOS and EOS pulses from which the mechanical misalignment is calculated. A gated clock is energized by the reference pulse and a tapped delay line is used for nanosecond resolution. After accomplishing correction for mechanical misalignment, chromatic aberrations are corrected by measuring the amount of total pel displacement of the non-reference scan line relative to the reference scan line and inserting appropriate delays at selected intervals throughout the non-reference scan in order to maintain pel placement accuracy to a desired tolerance.