The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 1990

Filed:

Oct. 28, 1988
Applicant:
Inventors:

David E Lopez, Tempa, AZ (US);

Tomas Colunga, Tempa, AZ (US);

Assignee:

Motorola Inc., Schaumburg, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 251 ; 371 226 ;
Abstract

A design and method of exhaustively verifying the boolean functionality of both combinational and sequential cells for Application Specific Integrted Circuit gate array and standard cell libraries is provided. A single integrated circuit includes a plurality of cells or macros from the library. A Gray code generator provides a plurality of Gray code signals to the cells in response to a binary counter. The binary and Gray code signals stimulate each state of each cell. A multiplexed output indicates the functionality of each state.


Find Patent Forward Citations

Lopez, David. (1990). Built-in self test method for application specific integrated circuit (U.S. Patent No. 4949341). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4949341

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…