The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 1990

Filed:

Jan. 09, 1989
Applicant:
Inventor:

Thomas J Keane, Gaithersburg, MD (US);

Assignee:

BYK-Gardner, Inc., Silver Spring, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
25022729 ; 350 961 ; 356244 ; 356432 ; 356445 ;
Abstract

An appliance for converting an optical reflectance measuring instrument into a transmittance measuring instrument is shaped to fit in the aperture of a probe of the reflectance measuring instrument. When used as a reflectance measuring instrument, reflectance samples are positioned over the aperture. The appliance has a fiber optic cable which receives light from the probe and carries it out through the aperture and redirects the light back toward the aperture through a position designed to receive a sample, the transmittance of which is to be measured. In the optical instrument, the light received by the probe is carried by fiber optics to a spectrometer.


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