The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 1990

Filed:

Nov. 23, 1988
Applicant:
Inventors:

Shigemi Murakawa, Chiba, JP;

Seiji Taguchi, Chiba, JP;

Makoto Nomura, Chiba, JP;

Ryoji Takabe, Chiba, JP;

Yoshiharu Iwashita, Chiba, JP;

Masahiro Ishii, Chiba, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F / ; C21B / ;
U.S. Cl.
CPC ...
7329 / ; 7330 / ; 266 99 ;
Abstract

A burden distribution monitoring apparatus, according to the present invention, includes a hollow cylindrical sonde having an inner end radially movable within the internal space of a furnace, such as a shaft furnace. The sonde carries a burden layer depth sensor and/or a burden grain distribution sensor for radially shifting working ends of the sensors. With the foregoing construction, burden depth and/or grading of the burden can be monitored in a plurality of radial points in the furnace.


Find Patent Forward Citations

Loading…