The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 1990
Filed:
Apr. 29, 1988
Applicant:
Inventors:
Philip T Kan, Fullerton, CA (US);
William R Yueh, Fullerton, CA (US);
Assignee:
General Dynamics Corporation, Pomona Div., Pomona, CA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D / ;
U.S. Cl.
CPC ...
25023112 ; 33318 ; 74 / ; 25022729 ;
Abstract
An apparatus for detecting deflection of the spin axis of a gimbal supported spinning mass relative to the gimbal axis comprises four equally spaced linear arrays of detector elements mounted around the gimbal axis and extending parallel to that axis. Four light sources are provided, each one in alignment with a respective one of the arrays, and a reflective surface is provided on the spinning mass for reflecting light onto the respective detector arrays. Deflection of the spin axis will be registered by displacement of a reflected light spot in one or more of the arrays.