The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 27, 1990
Filed:
Jul. 21, 1988
William C Randle, Bend, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
A microprocessor controlled test system generates and transmits distorted digital signals to a system under test by expanding a bit pattern, representative of a character to be transmitted, by an integer multiple of expansion. Selected bits of the expanded bit pattern are toggled from one logic level to another under program control to produce a distorted expanded bit pattern. The distorted expanded bit pattern is clocked out of the test system to the system under test at a rate equal to the integer multiple of expansion times the baud rate of the system under test. The resolution of the test signal can be varied by changing the integer multiple of expansion along with the rate at which the test signal is clocked out of the test system. The invention is useful in testing and adjusting a teletypewriter.