The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 1990
Filed:
Jun. 14, 1988
David B Johnson, Portland, OR (US);
Mark S Myers, Portland, OR (US);
Eileen Riggs, Hillsboro, OR (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
An integrated circuit module (200) in which an error detection circuit (234, 263) compares data (204) generated internally on module (200) with data (108) generated externally from another substantially identical module (100). An error detect output (238) is asserted upon the condition that data (204) generated internally on module (200) and data (108) generated externally from module (100) do not match. A circuit (222, 224) alters the internally generated data (204) by injecting erroneous data into the internally generated data (204) to thereby generate altered data (230). Error anticipation control logic (210) generates a test condition (214, 216), which corresponds to the expected error condition caused by altered data. Comparison circuit (242) compares the actual error detect output (238, 240) with expected error detect output (214, 215). An error output (244) is asserted if the actual error detect output (238, 240) and the expected error detect output (214, 216) do not match.