The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 1990

Filed:

Aug. 23, 1988
Applicant:
Inventors:

Hideo Morita, Kawasaki, JP;

Kenji Abiko, Kawasaki, JP;

Katsuaki Anzawa, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
33561 ; 33559 ;
Abstract

The present invention relates to a surface contour measuring tracer permitting a probe element to move in the directions of X-, Y- and Z-axes. A support structure includes a base supporting thereon an X-slider and a Y-slider which are movable in the directions of X- and Y-axes, respectively. A Z-slider is supported on the X-slider so to be movable in the direction of a Z-axis. Supported on the Z-slider is a probe element, the movements of which in the directions of X-, Y- and Z-axes are permitted by the movements of the X-, Y- and Z-sliders. The X- and Y-sliders are normally held at neutral positions by a wire spring extending in the direction of the Z-axis, and the Z-slider is permitted to move in the direction of the Z-axis against the action of a coil spring and normally held at a neutral position.


Find Patent Forward Citations

Loading…