The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 1989

Filed:

Nov. 07, 1986
Applicant:
Inventors:

Kazuhisa Shiraishi, Odawara, JP;

Kazuo Nakagoshi, Odawara, JP;

Takuji Ogawa, Odawara, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B / ; G11B / ; G01R / ;
U.S. Cl.
CPC ...
360 25 ; 360 31 ; 360 45 ; 324212 ;
Abstract

Because of increase in data recording density on a magnetic disk in recent years, a minute defect which posed no problem in the past exerts adverse influence upon the recording and reproducing characteristics. An object of the present invention is to provide a method and an apparatus for detecting minute defects on a magnetic disk. In order to achieve this object, the present invention was made on the basis of the recognition that a large defect on the magnetic disk largely decreases the amplitude of the reproduced signal and shifts its phase, whereas a small defect does not decrease the amplitude of the reproduced signal so largely but causes a phase shift. Therefore, defects on the magnetic disk are detected by monitoring the amplitude decrease and phase shift of the reproduced signal.


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