The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 1989
Filed:
Aug. 05, 1988
Michimasa Terada, Tokyo, JP;
Hisashi Nakajima, Yamanashi, JP;
Tokyo Electron Limited, Tokyo, JP;
Abstract
A mechanism according to the present invention comprises a quadric crank chain disposed substantially within a vertical plane to support a test head of wafer probing machine, a cylinder mechanism coupled to a first movable link corresponding to the side opposite to a fixed link of the quadric crank chain, the cylinder mechanism serving to slide the first movable link in a vertical direction, and a guide member for supportingly guiding the cylinder mechanism in a horizontal direction. The test head is attached to a second movable link, which corresponds to a side adjacent to the fixed link of the quadric crank chain, so that the test head, along with the second movable link, revolves within the vertical plane when the first movable link slides vertically.