The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 1989
Filed:
Sep. 30, 1988
Applicant:
Inventors:
Teiji Nagai, Fujisawa, JP;
Ryo Sakazume, Tokyo, JP;
Kouichi Hanazawa, Warabi, JP;
Hiroshi Nakayama, Kasukabe, JP;
Yoshio Minagawa, Tokyo, JP;
Assignees:
Sapporo Breweries, Ltd., Tokyo, JP;
Scan Technology Co., Ltd., Warabi, JP;
Primary Examiner:
Int. Cl.
CPC ...
G06K / ; B41V / ; G01D / ;
U.S. Cl.
CPC ...
346-11 ; 209583 ; 209939 ; 346 25 ; 346 75 ; 358101 ; 358106 ; 382-8 ; 382 34 ;
Abstract
A method for inspecting whether a print pattern composed of a number of dots is acceptable, an apparatus for inspecting such a print pattern, and an automatic print sorting system are disclosed. A print pattern of an acceptable print sample and a print pattern printed on an article to be inspected are compared with respect to dot distribution, dot density, and other factors. The print patterns on all articles on a high-speed production line can be automatically inspected.