The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 1989

Filed:

Jul. 10, 1987
Applicant:
Inventors:

Masatoshi Ono, Ibaraki, JP;

Wataru Mizutani, Ibaraki, JP;

Hiroshi Murakami, Ibaraki, JP;

Hiroshi Bando, Ibaraki, JP;

Shigeru Wakiyama, Tokyo, JP;

Fumiki Sakai, Tokyo, JP;

Takashi Wakatsuki, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250306 ; 2504421 ;
Abstract

A relative displacement control apparatus provides both coarse and extremely fine precise control over displacements between a sample and a detecting probe as required, e.g. in operations of optical instruments, analyzing instruments and scanning tunneling microscopes. This precise fine displacement is produced through a double-lever-action which is created substantially by means of an arm assembly preferably with a piezoelectric drive for precise displacement control, a support pivotally holding the arm assembly, a rigid arm fixed solidly atop the support and a pointed stop or 'foot' fixed in the proximity of the free end of the rigid arm.


Find Patent Forward Citations

Loading…