The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 1989

Filed:

Nov. 19, 1982
Applicant:
Inventor:

Peter R Hanley, Gloucester, MA (US);

Assignee:

Varian Associates, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
2504922 ; 437 20 ; 437928 ; 437931 ;
Abstract

A method for pretreatment of a photoresist layer adhered to a semiconductor wafer prior to charged particle beam processing. The method includes bombarding the photoresist layer with ions which are electrically inactive with respect to the wafer. Suitable ions include ions of the noble gases. The pretreatment method causes rapid photoresist outgassing and carbonization without altering the electrical properties of the wafer. Outgassing during subsequent processing is thereby reduced. The pretreatment method is particularly applicable to ion implantation wherein dose measurement errors resulting from photoresist outgassing are reduced. The pretreatment method is performed at high current to minimize the effect on system throughput.


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