The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 1989
Filed:
Aug. 31, 1987
Applicant:
Inventors:
Assignee:
Tokyo Kogaku Kikai Kabushiki, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356347 ; 364525 ;
Abstract
A method of analyzing interference fringes for use in a holographic interferometry process for measuring, by using a computer generated hologram, the shape of an object to be examined. The method comprises:
Yokokura, Takashi. (1989). Method of and apparatus for analyzing interference fringes (U.S. Patent No. 4848907). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4848907
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