The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 1989

Filed:

May. 31, 1988
Applicant:
Inventors:

Hiroshi Itaya, Isehara, JP;

Takehiko Kawauchi, Ayase, JP;

Assignee:

Anritsu Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G04F / ;
U.S. Cl.
CPC ...
368120 ; 324 / ; 324 / ;
Abstract

A frequency converter receives a signal to be measured and a local oscillation signal supplied from a local oscillator and ouputs an intermediate frequency signal. A phase detector detects a phase of the intermediate frequency signal. An A/D converter outputs a digital value corresponding to a phase detection output. A memory stores a plurality of aperture values. Each of the aperture values is read out with a predetermined frequency band which is incremented at a predetermined step. A first controller causes the local oscillator to oscillate signals having first and second frequencies separated from each other by the aperture value in the vicinity of a desired measurement frequency. An arithmetic unit calculates a group delay time of the signal to be measured in accordance with the two digital values and the aperture value corresponding to the respective phase detection outputs when the local oscillator oscillates the signals having the first and second frequencies. A second controller causes the memory to start or to stop reading and incrementing the aperture value when the group delay time is determined to be smaller or larger than a reference value.


Find Patent Forward Citations

Itaya, Hiroshi. (1989). Group delay time measurement apparatus with automatic aperture value (U.S. Patent No. 4845691). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4845691

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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