The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 1989
Filed:
Jun. 29, 1988
Anritsu Corporation, Tokyo, JP;
Abstract
In a siganl analyzer apparatus, a signal received while a local oscillator is swept in a analog manner is selected and detected by an IF circuit using a desired RBW, and the resultant data is stored in a memory and displayed on a display unit. A sweep signal generator controls the local oscillator in an analog manner such that frequency measurement can be performed within a desired measuring frequency range. A peak search section outputs a frequency valve corresponding to the maximum value of the data in the memory. A discriminator compares the span set in the sweep signal generator with the resolution bandwidth set in the IF circuit, when a frequency is measured using the desired span, and outputs the obtained value. A frequency controller causes the sweep signal generator to perform sweeping/measurement by setting a frequency detected by the peak search as a center frequency, and by using a span narrower than that used in the previous measurement cycle, on the basis of the comparison result from the discriminator. A frequency measuring section measures the frequency of an input signal using the output frequencies from the local oscillator and the IF circuit, on the basis of the comparison result from the discriminator, when the frequency controller causes the sweep signal generator to perform frequency measurement by minimizing the span.