The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 23, 1989

Filed:

Feb. 19, 1988
Applicant:
Inventors:

James A Bondur, Walden, NY (US);

Francois D Martinet, Boissise Le Roi, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B44C / ; C03C / ; C03C / ;
U.S. Cl.
CPC ...
156643 ; 156646 ; 156653 ; 156657 ; 1566591 ; 20419237 ; 252 791 ; 437241 ;
Abstract

A gas mixture for use in the selective dry etching of a nitride insulator layer relative to an oxide insulator layer comprising: a gas mixture containing chlorine and oxygen. The oxygen in this gas mixture must comprise 15% or less by volume. In a preferred process embodiment for ethcing Si.sub.3 N.sub.4 and leaving a layer of SiO.sub.2 therebelow, Cl.sub.2 gas may be used in combination with 12% or less oxygen by volume. Etch selectivity of greater than five to one is achieved with this gas mixture when a plasma RF frequency of less than 1 MHz is utilized. When a high frequency RF component in the range of 10-27 MHz is added to the RF excitation signal, then an etch uniformity of better than 3% is achieved.


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