The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 18, 1989

Filed:

May. 09, 1988
Applicant:
Inventors:

Faivel Pintchovski, Austin, TX (US);

Philip J Tobin, Austin, TX (US);

Assignee:

Motorola, Inc., Schaumburg, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ; H01L / ;
U.S. Cl.
CPC ...
437192 ; 437201 ; 437190 ; 437195 ; 437246 ; 437228 ; 437238 ; 437200 ; 357 71 ; 148D / ; 148D / ; 148D / ;
Abstract

A method is disclosed for fabricating a semiconductor device and especially for contacting a semiconductor device. A silicon substrate is provided which has a device region formed at the surface thereof and which is contacted with a silicide. An insulating layer overlies the substrate and has an opening therethrough which exposes a portion of that device region. Titanium nitride is deposited in a blanket layer overlying the silicide and the insulating layer. A leveling agent such as a spin-on glass is applied to the structure to substantially fill the opening. That leveling agent is then anisotropically etched to leave the leveling agent only in the opening. The leveling agent is used as an etch mask to remove the portion of titanium nitride which is located outside the opening. After removing the remaining leveling agent, the titanium nitride in the opening is used as a nucleating surface for the selective deposition of a tungsten plug which fills the contact opening. The titanium nitride layer serves as both a nucleating surface and as a barrier layer which separates the tungsten from the underlying silicon.


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