The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 28, 1989

Filed:

Oct. 23, 1987
Applicant:
Inventors:

Ronald R Lentz, Plymouth, MN (US);

Dan J Wendt, Lino Lakes, MN (US);

Jonathon D Kemske, New Brighton, MN (US);

Peter S Pesheck, Brooklyn Center, MN (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05B / ;
U.S. Cl.
CPC ...
219 / ; 219 / ; 219 / ; 374119 ; 324 / ; 426107 ; 426234 ;
Abstract

A method and apparatus for measuring strong microwave electric field strengths is disclosed. The apparatus includes a first active temperature probe in cooperation with susceptor means for measuring a temperature indicative of the heating effects of microwave radiation at a test location, and an ambient temperature probe for measuring ambient temperature. The temperature differential between the two probes is used by calibration means for determining electric field strength at the test location. The method includes the steps of heating a susceptor means with microwave radiation, and measuring a temperature indicative of the heating effects of microwave radiation at the test location. Ambient temperature is measured, and the temperature differential used to determine the magnitude of the electric field strength.


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