The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 14, 1989

Filed:

Nov. 26, 1986
Applicant:
Inventor:

David D Stubbs, Portland, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G01R / ;
U.S. Cl.
CPC ...
364487 ; 324 / ; 3241 / ; 364485 ; 364521 ;
Abstract

A signal viewing instrumentation control system includes a programmable test instrument, a computer having an input keyboard and/or mouse, a CRT display and a communications interface for the computer to communicate with the test instrument. The test instrument can be a digitizer, a spectrum analyzer, a power supply or a signal generator. The system includes software for the user to interactively control the test instrument through the computer. The software includes a functional characterization of the test instrument for inversely transforming a generic output for the instrument into a generalized set of control setting commands for controlling operation of the instrument. The user can graphically enter into the computer a user-specified output for the instrument. The computer converts the graphically-specified output into a specific set of the control setting commands and transmits the specific commands to the test instrument to control its operation. The user can thereby interactively control the test instrument to provide an output function replicating a desired output function without having to enter a control settings to the test instrument either manually or as program language control statements.


Find Patent Forward Citations

Loading…