The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 1989
Filed:
Apr. 17, 1987
Mitutoyo Corporation, Tokyo, JP;
Abstract
A method of and apparatus for effecting spatial coordinate measurement of the contour or the like of an object to be measured in which a plurality of probes are successively used in accordance with the modes of measurement. In one of the probes adapted for measuring the roundness or the like the object, the posture of the probing tip can be changed relative to the main body of the probe by the driving operation of a threaded shaft which extends in the direction perpendicular to the axis of the main body of the probe. A means for driving this threaded shaft is disposed on the side of a probe stocker. The posture of the probing tip is thereby preliminarily changed so as to enable a corresponding predetermined measuring process in which the probe will be used.