The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 14, 1989

Filed:

Nov. 22, 1985
Applicant:
Inventors:

Sherra E Diehl-Nagle, Durham, NC (US);

John R Hauser, Raleigh, NC (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C / ; G11C / ;
U.S. Cl.
CPC ...
365154 ; 365190 ; 365156 ; 357 236 ;
Abstract

A CMOS SRAM exhibiting a high level of immunity to single event upset errors, such as caused by ionizing radiation, is disclosed. In CMOS SRAM cells with small feature sizes, single event errors result from ion interactions with transistor drains on the side of a cell holding a low voltage. The configuration of the cell presents a high impedance between these low voltage drains and the low voltage gate on the opposite side of the cell, while presenting a high impedance between corresponding components with high voltages. The SRAM cell is protected from single event errors while minimizing the increase in switching speed which accompanies any increase in internal cell impedance.


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