The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 1989
Filed:
Apr. 14, 1986
Robert G Knollenberg, Boulder, CO (US);
Particle Measuring Systems, Inc., Boulder, CO (US);
Abstract
A detection device is disclosed for determining particle size from particle effected light scattering in a sensing region receiving the particles in a gas carrier, such as air, and a laser beam to illuminate the sensing region. Background light from molecular scattering is reduced to a level that enables light scattered by particles having a size of at least as low as about 0.1 micron to be sensed in a high background of molecular scattering such as, for example, where molecular scattering can exceed the 0.1 micron particle's scattering by one hundred times. High molecular scattering is generated whenever the gas volume being viewed is large as is required for high flow rates, high molecular density (high pressures), or large gas molecules. This high sensitivity at high molecular scattering background is achieved through use of a linear array of detectors positioned, with respect to an imaging system, so that each detector monitors a different portion of the sensing region and provides an electrical output signal indicative of sensed particle presence within that portion monitored. The output signals from the detectors are parallel processed and coupled to a converter which provides an output indicative of the particles sensed in the entire sensing region.