The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 29, 1988
Filed:
Nov. 05, 1986
Shigetoshi Kurozumi, Settsu, JP;
Tadahiro Abe, Chiba, JP;
Hideo Maruyama, Mukou, JP;
Noriko Yasui, Yachiyo, JP;
Rigaku Industrial Corporation, Takatsuki, JP;
Kawaski Steel Corporation, Kobe, JP;
Abstract
For analyzing the solution specimen according to the fluorescent X-ray analyzing method, a certain quantity of solution specimen to be analyzed is impregnated into a thin porous sheet, for example by dripping method, and the sheet is dried for evaporating the solvent. Held on an appropriate holder, for example, the sheet is placed in the vacuum atmosphere or the atmosphere of helium gas, so that the primary X-rays are irradiated and the wavelength or the intensity of the fluorescent X-rays generated from the solute remained in the sheet may be detected. The concentration of the solution may be changed by concentration or by dilution, so that an adequate intensity of the fluorescent X-ray may be generated. The specimen sampler is made of porous sheet material, to which the solution specimen to be analyzed is impregnated and dried to remain only the solute of the solution in the sheet. To the circumferential edge of the sheet is attached a circular edge of a support, so that the central portion of the porous sheet is sufficiently spaced from the circumferentially provided support.