The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 1988

Filed:

Oct. 01, 1984
Applicant:
Inventor:

James L Tallman, Hillsboro, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364550 ; 364150 ; 364578 ; 371 25 ;
Abstract

A method and apparatus is disclosed for the improved monitoring and detection of improper device operation. Operation of a prototype device is first modeled. In particular, a set of test vectors is selected to provide a desired degree of testing of the prototype unit. The expected response of the prototype to the selected set of test vectors is determined through the use of analytical prediction means, and stored for subsequent comparison with the operation of the prototype unit. Thereafter, the selected set of test vectors are applied to the prototype unit, and the response thereto compared in real time with the expected responses. Improper operation of the prototype device is thereby identified, and associate information recorded for subsequent analysis.


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