The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 1988
Filed:
Aug. 29, 1986
Applicant:
Inventors:
Leonard M Anderson, San Jose, CA (US);
Mathew G Boissevain, Los Altos Hills, CA (US);
M Kent Norton, Saratoga, CA (US);
Assignee:
Measurex Corporation, Cupertino, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250571 ; 250339 ; 356429 ;
Abstract
A system and method for optically measuring parameters such as dry basis weight of fibrous sheet materials during manufacture without scanning. The system includes mirror sections for reflecting modulated light as parallel rays perpendicularly incident upon one surface of a traveling web, and a plurality of light detection devices to detect light transmitted through the web at two distinct wavelengths. The system further includes ducts to environmentally isolate the mirror sections and the light detection devices.