The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 1988
Filed:
May. 26, 1987
John D Blattner, Beaverton, OR (US);
David B Moser, Portland, OR (US);
Sam M Deleganes, Aloha, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
A measurement instrument has a plurality of operation levels with different respective sets of operational functions associated therewith. Each operational function has at least two independently selectable characteristics related thereto. When an operation level of the instrument is selected, the instrument displays the characteristics related to each operational function associated with the selected operation level, and the operator is able to select one characteristic related to the or each operational function associated with the operation level. The characteristics related to at least one of the operational functions may each have a single value, e.g. relating to a mode of operation of the instrument. If one of the characteristics has a range of values, a value of that characteristic may be selected within the range.