The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 1988
Filed:
Aug. 12, 1985
John Birkner, Sunnyvale, CA (US);
Hua T Chua, Los Altos Hills, CA (US);
Andrew K Chan, Milpitas, CA (US);
Albert Chan, San Jose, CA (US);
Monolithic Memories, Inc., Santa Clara, CA (US);
Abstract
A programmable logic array (100) includes a set of input terms which are programmably coupled to a first set of AND gates (102-1) through 102-66). The output signals from the first set of AND gates are programambly electrically connected to a second set of AND gates (104-1 through 104-66). The second set of programmable AND gates enhances flexibility of design and permits product terms with a larger number of factors to be generated. The output leads from the second set of AND gates are programmably electrically coupled to a first set of OR gates (106-1 through 106-22) which in turn are programably electrically coupled to a second array of OR gate logic (108-1 through 108-10). This also permits greater design flexibility. The output terms from the second set of OR gate logic can then be used to generate the output signals from the programmable logic array (100). In addition, a bus (110) is programmably electrically coupled to each of the output signals from the second OR logic array and the output signals (O.sub.1 through O.sub.10) of the PLA. Because of this, different output terms can be routed to different output pins thus permitting the designer to select his pin out independently of the availability of gate within specific parts of the array.