The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 26, 1988
Filed:
Jun. 04, 1986
Eiichi Nishimura, Hitachi, JP;
Kazumichi Suzuki, Mito, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
This invention relates to a method and apparatus for positron extinction analysis which irradiates a positron beam to a sample to be analyzed through a convergent lens system consisting of a magnetic lens and measures the extinction .gamma.-rays generated from the sample for the positron extinction analysis. The invention utilizes the property of the magnetic lens of an electron microscope that the magnetic lens has the same focal distance for both the positron and the electron having mutually the same energy. If the magnetic lens of the electron microscope is used as a convergent lens system for a positron beam, the positron beam can be radiated highly accurately to a very small, local position of the sample which is being observed through the electron microscope. For instance, in the case of a transmission type electron microscope, the convergent lens system of the electron beam is used as a convergent lens system of the positron beam.