The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 19, 1988
Filed:
Oct. 15, 1985
Applicant:
Inventors:
Assignee:
Hitachi, Ltd., Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01R / ;
U.S. Cl.
CPC ...
324232 ; 324227 ; 324238 ;
Abstract
Equipment to measure flaws in an object using an eddy current. According to this equipment, attention is given to a relation between the amplitude of signal detected when the eddy current probe is scanning and the position of the eddy current probe, and the size of flaw is measured based upon the fact that scan distance of probe in which flaw detection signals of greater than a predetermined threshold value are obtained, is subject to change depending upon the depth of penetration of eddy current.