The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 1988
Filed:
Feb. 27, 1986
Shin Eguchi, Atsugi, JP;
Seigo Igaki, Inagi, JP;
Hironori Yahagi, Yokohama, JP;
Fumio Yamagishi, Ebina, JP;
Hiroyuki Ikeda, Yokohama, JP;
Takefumi Inagaki, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
An uneven-surface data detection apparatus, includes a transparent plate having an uneven-surface contact portion against which an uneven surface to be detected is pressed. A light source illuminates the uneven-surface contact portion through the transparent plate. An uneven-surface image drawing out optical element draws out the light reflected on the uneven-surface contact portion of the transparent plate. A detector detects the light drawn out from the transparent plate by the optical element. Light reflected by a projection-facing portion of the uneven surface contact portion to be introduced into the detector diverges from a propagation direction of light reflected by a recess-facing portion of the uneven surface contact portion. The optical element is arranged to guide the light reflected by the projection-facing portion into the detector.