The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 23, 1988

Filed:

Oct. 09, 1985
Applicant:
Inventors:

Kenji Nakatsugawa, Kanagawa, JP;

Aiichi Katayama, Isehara, JP;

Hitoshi Sekiya, Atsugi, JP;

Assignee:

Anritsu Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ; H01J / ;
U.S. Cl.
CPC ...
315-1 ; 315-3 ; 3241 / ; 340733 ;
Abstract

Digital wave observation apparatus includes first and second A/D converters to convert input signals of first and second channels into corresponding first and second digital signals. First and second delay circuits selectively delay the first and second digital signals, and a wave memory stores signals output from the first and second delay circuits for purposes of display. A first command device receives channel designating data corresponding to the first channel and desired delay value setting data, and provides first delay data to a first delay value setting device coupled to the first delay circuit. A second command device receives designating data corresponding to the second channel and desired delay value setting data, and provides second delay data to the first delay value setting device and a second delay value setting device coupled to the second delay circuit.


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