The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 1988
Filed:
Jul. 22, 1986
Donald F Murray, Portland, OR (US);
Steven K Sullivan, Beaverton, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
A calibrated automatic test system includes a test station for generating digital test function codes and a test head containing a plurality of I/O pins for connection to a device under test. Each I/O pin includes a pin electronics circuit responsive to the digital test function codes for providing test signals to the device under test. The pin electronics circuits are inexpensive CMOS IC's and lack the accuracy needed to test VLSI devices at the frequencies of interest. An external calibration unit is connected to each I/O pin and data measurements are taken which represent the performance of the CMOS IC's. The data measurements are converted to calibrated function codes representing desired data values which are then stored in correction memory circuits which respond to nominal digital test function codes and substitute in their places calibrated function codes which are then supplied to the pin electronics circuits.