The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 1987
Filed:
Feb. 20, 1986
Kazuya Hoshino, Tokyo, JP;
Hiroyuki Matsuura, Tokyo, JP;
Yokogawa Electric Corporation, Tokyo, JP;
Yokogawa Medical Systems, Limited, Tokyo, JP;
Abstract
A method of simultaneously correcting distortion in density due to uneven sensitivity of receiving coils, and location dependent phase distortion inherent in the system, wherein a phantom is scanned to determine echo signals, which echo signals are subjected to 2-dimensional inverse Fourier transformation, to obtain an image (Cij) and stored as it is in the form of a complex number, then the object to be examined is measured by similar operation to obtain an image (Oij) and wherein the image (Oij) is divided by computation with image (Cij) as follows .vertline.Sij.vertline.=.vertline.Oij.vertline./.vertline.Cij.vertline., by which equation computation is made to correct for density distortion, and wherein the angle of deviation is set as follows arg [Sij]=arg[Oij]-arg[Cij].ident.0, by which equation computation is made to correct for phase distortion. An image of the object is thus obtained which is corrected for density distortion and for phase distortion, by taking the real number part of the image Sij which is the determined image of the object.