The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 1987

Filed:

Feb. 13, 1986
Applicant:
Inventors:

Yabusaki Kenji, Kashiwa, JP;

Tozawa Hitoshi, Tokyo, JP;

Noda Akira, Tokyo, JP;

Ito Takashi, Ohmiya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356222 ; 356230 ;
Abstract

A photometrical apparatus has a first light receiving element, and a second light receiving element less sensitive to temperature and other environmental influences than said first light receiving element whereby a value Pm of measured quantity of light from the subject is calculated from the following formula ##EQU1## Pr designates a quantity of light from a standard light source, Dr and Dm designate outputs of the first light receiving element generated by the light from the standard light source and the subject, Dpo and Dpt designate outputs of the first light receiving element generated by the light from the reference light source and the subject, and Dso and Dst designate outputs of the second light receiving element generated by the light from the reference light source and the subject.


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