The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 1987

Filed:

Sep. 17, 1985
Applicant:
Inventors:

Arnold M Frisch, Portland, OR (US);

Allen L Hollister, Beaverton, OR (US);

Larry L Hutchinson, Beaverton, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 20 ; 371 16 ; 324 / ; 364200 ;
Abstract

A computer-based instrument system is provided for progammably configuring a variety of computer-based test instruments for performing a variety of tests and permitting high speed execution of tests through concurrent operation of individual test instruments. The instruments are implemented on circuit boards and mounted in a chassis including permanent backplane wiring interconnecting the instruments and a timing and triggering control unit. The backplane wiring includes a conventional computer bus for carrying instructions from a master controller to each instrument and lines for a common system clock signal, protocol signals, and trigger signals between selected instruments and the timing and triggering control unit for synchronizing the operation of the instruments when performing a test. The timing and triggering control unit is adapted to programmably control instrument triggering according to individual test requirements without modification of backplane wiring. The backplane wiring further includes a high speed data bus for rapidly transferring data between instruments in the course of a test.


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