The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 1987
Filed:
Feb. 24, 1986
Hideto Iwaoka, Tokyo, JP;
Tadashi Sugiyama, Tokyo, JP;
Hiroyuki Matsuura, Tokyo, JP;
Takaaki Hirata, Tokyo, JP;
Yokogawa Electric Corporation, Tokyo, JP;
Abstract
In a nuclear magnetic resonance imaging device, a pulse sequence is selected and a variance or standard deviation of a calculated image for T1, T2, .rho. is determined as a function of scan parameters from the theoretical equation of signal intensity in the pulse sequence and the variance in the values for T1, T2, .rho. to be measured and the original image. Scan parameters, with which the total sum of variance or standard deviation of the calculated image takes a minimum value, are determined as optimum values. An image is obtained from the optimum scan parameters to obtain a plurality of original images. A calculated image for T1, T2, .rho. is determined, based on the original images, whereby a calculated image of high quality is simultaneously obtained.