The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 15, 1987
Filed:
Oct. 28, 1985
Katsuichi Kitagawa, Moriyama, JP;
Kouichi Tamura, Kudamatsu, JP;
Toray Industries, Inc., Tokyo, JP;
Abstract
A method for determining positions of points on a surface of an article including the steps of: detecting apparent positional information of the points from an image of the arrangement of the points; detecting a relative difference between the apparent positional information and predetermined positional information according to design data of the arrangement of the points; and modifying the apparent positional information by the relative difference, which modified information is transmitted to a subsequent system for positioning the point in place. By this, it is possible to inspect a plurality of apertures arranged with a predetermined relationship to each other, such as holes on a nozzle plate of a spinneret, in which apertures are sequentially positioned under a microscope according to positional signals generated based on the positional information obtained.