Ic test equipment

Abstract

An IC element supplied to a testing station is guided by a rail and a guide member to move by its own weight. At least one of the rail and guide member has built therein plate-shaped ceramic heater or plate-shaped silicone rubber heater. The guide member urges the IC element against the rail to heat the IC element. An auxiliary stopper is provided opposite but aslant to the IC element sliding surface of the rail. The IC element moving on the rail is yieldingly urged by the auxiliary stopper against the sliding surface of the rail, braked and engages an engaging piece at the lower end of the auxiliary stopper. The IC element is disengaged from the engaging piece to slightly move and stopped by a main stopper, where the IC element is tested. A plurality of such testing passages are provided, and IC elements simultaneously tested in the testing passage are fed to discharge rails respectively corresponding thereto. A plurality of sorting rails are provided in a manner to be movable in the direction of arrangement of the discharge rails, and the spacing of the discharge rails and the spacing of the sorting rails are selected equal to each other so that the IC elements on the discharge rails are simultaneously transferred to the sorting rails. The sorting rails move in a direction in which a plurality of receiving passages of an unloader are arranged at intervals different from those of the sorting rails. One of the sorting rails is selectively connected to one of the receiving passages according to the test results, feeding the IC element on the rail to the unloader.