The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 1987

Filed:

Mar. 29, 1985
Applicant:
Inventors:

Haruo Seto, Tokyo, JP;

Kazuo Furihata, Tokyo, JP;

Muneki Ohuchi, Tokyo, JP;

Assignee:

JEOL Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324307 ;
Abstract

The present invention provides a nuclear magnetic resonance spectroscopy that permits one to see changes in spectra without the use of long-range coupling even if the obtained resonance lines split into complex multiplet patterns. The spectrometry comprises the steps of: (a) applying a pulse train of radio-frequency irradiation to a nucleus under observation; (b) applying weak radio-frequency irradiation having a frequency equal to the resonance frequency either of an unobserved nucleus coupled to the observed nucleus or of the observed nucleus in synchronism with the application of the pulse train; (c) receiving the free induction decay signal produced after the application of the pulse train and storing it in a memory; (d) applying a pulse train of radio-frequency irradiation to the observed nucleus; (e) receiving the free induction decay signal produced after the application of the pulse train in step (d) and either adding it to the free induction decay signal stored in step (c) or substracting it from the previously stored signal; and (f) taking the Fourier transform of the free induction decay signal obtained by the arithmetic operation in step (e).


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