The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 1987
Filed:
Jun. 15, 1984
Applicant:
Inventor:
Kazuo Nakaizumi, Tokyo, JP;
Assignee:
NEC Corporation, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C / ;
U.S. Cl.
CPC ...
365222 ; 365201 ; 371 21 ;
Abstract
A dynamic random access memory device is equipped with a test circuit for testing an internal refresh circuit. In a test mode, the content of an internal address counter is supplied to both the row of column address decoders, by which one memory cell disposed on the diagonal in a memory cell array is designated. Further, data is written into the designated memory cell from outside of the memory device, and the data stored in the designated memory cell is then read out to check whether the read-out signal is coincident with the written data.
Nakaizumi, Kazuo. (1987). Dynamic random access memory device provided with test circuit for (U.S. Patent No. 4672583). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4672583
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile