The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 1987

Filed:

Oct. 10, 1984
Applicant:
Inventors:

Hideto Iwaoka, Tokyo, JP;

Tadashi Sugiyama, Tokyo, JP;

Hiroyuki Matsuura, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324309 ; 324307 ;
Abstract

In an examination method and apparatus utilizing nuclear magnetic resonance, high frequency pulses for producing nuclear magnetic resonance are applied by successively imposing a first 90.degree. pulse, a first 180.degree. pulse, a second 90.degree. pulse, and a second 180.degree. pulse substantially immediately after the second 90.degree. pulse, and a next pulse sequence is initiated upon elapse of a wait time after the second 180.degree. pulse has been applied. The wait time is rendered much shorter than the conventional prior art wait times for high speed scanning operation, by forcibly aligning magnetization M first with the direction of a -Z direction axis and then with the direction of a +Z direction axis, using the second 90.degree. pulse and the second 180.degree. pulse. By applying a number of first 180.degree. pulses, a number of nuclear magentic resonance signals are produced for additionally shortening the overall measurement time.


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