The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 1987

Filed:

Mar. 26, 1985
Applicant:
Inventor:

Yoichi Murayama, Tokyo, JP;

Assignee:

Kuraray Co., Ltd., Kurashiki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B05D / ;
U.S. Cl.
CPC ...
427 39 ; 427166 ;
Abstract

Chalcogenide suboxide, particularly tellurium oxides TeOx, are possible to reversibly change optical characteristics by changing power of irradiating light to repeat recording and erasure. If the TeOx is x<1, high sensitivity is obtained but the characteristic of film is greatly deteriorated due to the environment. In accordance with this invention there is proposed a film which can be used as an optical recording medium having a high sensitivity and a high stability under the conditions that a partial pressure of oxygen is in the range from 1.times.10.sup.-4 -9.times.10.sup.-3 Torr and a high frequency power for forming a plasma in the range of 50-500 W and wherein the TeOx film is formed by metal tellurium vapor passing through a plasma of oxygen gas.


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