The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 1987

Filed:

Sep. 21, 1984
Applicant:
Inventors:

Jiro Ohno, Kawasaki, JP;

Hirokatsu Yashiro, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250574 ; 250341 ; 250554 ;
Abstract

A method of imaging the surface of an object at high temperature includes the steps of: irradiating the surface of a high-temperature object with two different kinds of pulses of monochromatic light of a fundamental wave and a harmonic thereof; passing the reflected light from the surface of the object through both an interference filter which allows only the two different kinds of monochromatic light to pass and a high-speed optical switch thereby to remove any background light component; drawing out only the reflected light of the pulses and leading the same to an image generating mechanism where it is converted into an image; and controlling the voltage applied to the high-speed optical switch thereby to adjust the mixing ratio between two wavelengths. Also disclosed is an apparatus for imaging the surface of an object at high temperature which includes: a light pulse generator provided such as to be opposed to high-temperature object; and an interference filter, a half-mirror, a high-speed optical switch and an image generating mechanism which are successively disposed on the optical axis of the reflected light from the object.


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