The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 1987
Filed:
Aug. 22, 1984
Robert G Knollenberg, Boulder, CO (US);
Particle Measuring Systems, Inc., Boulder, CO (US);
Abstract
Particle measurement is disclosed utilizing orthogonally polarized components of a laser beam. A laser beam is split into orthogonally polarized components and at least one of the components is thereafter beam shaped to have a modified dimension. The components are then recombined and focused to provide a beam combination that is directed through a particle containing volume where scattering of the components occurs by the particles. With the components superimposed upon one another, a localized volume is created with one beam being contracted to a smaller volume than the other beam with the illumination intensity ratios thereat being either greater or less than unity depending upon the optics selected. Particle scattering events are observed within the localized volume in order to define those particles transitting through its central uniform intensity region (sample volume) independent of viewing circumstance by comparing scattered intensity ratios of the orthogonally polarized beam components using a polarizing analyzer and a pair of detectors. The scattering intensities measured of those particles transitting through the preferred sample volume are retained as valid size measurements. With the components in juxtaposition with respect to one another, flow velocity measurement is enabled by measurement of the transit times between the juxtapositioned components.