The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 1986
Filed:
Feb. 01, 1984
Applicant:
Inventors:
Assignees:
Hitachi, Ltd., Tokyo, JP;
Hitachi Cable, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D / ;
U.S. Cl.
CPC ...
2502 / ; 324 96 ;
Abstract
An apparatus for measuring electric field by making use of electrooptic effect includes an electrooptical crystal having a crystallographically eulytite structure such as Bi.sub.4 Ge.sub.3 O.sub.12, Bi.sub.4 Si.sub.3 O.sub.12 or Bi.sub.4 (Ge, Si).sub.3 O.sub.12 as a material with electrooptic effect. The optical electric-field measuring apparatus has an increased measuring sensitivity and a stabilized temperature characteristic and scarcely disturbs the distribution of electric field to be measured.
Nagatsuma, Kazuyuki. (1986). Optical electric-field measuring apparatus (U.S. Patent No. 4631402). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4631402
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile