The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 1986
Filed:
May. 24, 1983
Duane C Holmes, San Jose, CA (US);
Guillermo L Toro-Lira, Mountain View, CA (US);
Nanometrics Inc., Sunnyvale, CA (US);
Abstract
A computerized stage assembly for a Scanning Electron Microscope including a support frame, a tilt frame pivotally coupled to the support frame, an X carriage engaged with the tilt frame for movement in an X direction, a Y carriage engaged with the X carriage for movement in a Y direction, and a pedestal carried by the Y carriage and capable of rotation around an axis substantially normal to both the X and Y directions. The tilt frame, X and Y carriages, and pedestal are moved by computer controlled step motors. The tilting and rotating of a specimen secured to the pedestal is non-eucentric, i.e. the axis of rotation or tilt is not necessarily through the point of inspection on the specimen. A method is disclosed for automatically returning an inspection point to the viewing field of the microscope after a non-eucentric rotation or tilt.