The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 1986

Filed:

Mar. 29, 1985
Applicant:
Inventor:

Muneki Ohuchi, Tokyo, JP;

Assignee:

JEOL Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324307 ; 324310 ;
Abstract

The present invention relates to an improved nuclear magnetic resonance spectroscopy for selectively detecting multiple quantum transitions of a selected order, the transitions taking place in a sample containing a system of rotating magnetic resonators. The spectrometry comprises the steps of: (a) applying a pulse train to the resonators, the pulse train consisting of RF pulses in which at least one pulse is .phi. degrees out of phase with the last pulse; (b) detecting the free induction decay signal emanating from the resonators for a period of time t2 after the application of the pulse train, using two channels of detecting system which are 90.degree. out of phase with each other, and storing it in a memory. The steps are repeated changing the values of the evolution time t1, resetting the values of .phi., and adding 90.degree., 180.degree., and 270.degree. to all values of .phi.. The data are combined and converted to frequency domain by double Fourier transformation with respect to t1 and t2.


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