The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 21, 1986
Filed:
Apr. 05, 1984
Roy E Rand, Palo Alto, CA (US);
John W Mitchell, Redwood City, CA (US);
John L Couch, San Francisco, CA (US);
Imatron, Inc., San Francisco, CA (US);
Abstract
A scanning electron beam computed tomography scanner is disclosed herein and includes means defining a vacuum chamber, means for producing an electron beam at a first location in the chamber and for directing the beam to a second location therein along a particular desired path. A target of a type which produces X-rays as a result of the impingement thereon by the electron beam is positioned at a third location and means at the second location are provided to cause the beam to impinge on the target in a scanning fashion for producing X-rays. The scanner also includes a system for maintaining the electron beam on the desired path between the first and second locations. To this end, the system includes first means acting on the beam between these locations so as to detect for deviations, if any, between the actual path taken by the beam and the desired path and means responsive to these deviations, again if any, for adjusting the position of the electron beam in order to eliminate the deviations.